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Atomic Force Microscope NT-MDT Smena

Research equipment for analysis of morphology, mechanical properties, content and structure of materials

Atomic Force Microscope NT-MDT Smena

Contacts and Location

Contact 1 Karlis Kundzins
Enquire about this equipment
Organisational Unit Institute of Solid State Physics
    University of Latvia

Description

Research equipment for analysis of morphology, mechanical properties, content and structure of materials

Specification

Contact AFM, resonant Mode AFM (semicontact + noncontact), phase Imaging, force Modulation spreading resistance imaging, SCM, MFM, EFM. AFM, Voltage, RM Lithographies Piezo scanner range 50 x 50 x 2 μm Min. scanning step 15 pm Scan Type: by Probe Sample positioning range 5x5mm Positioning resolution 5μm Optical viewing system with field of view 0.5 to 2 mm

Services

Applied physics, material science, thin films

Funding Source

Other -
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