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“Metricon 2010” Prism coupler

Research equipment for analysis of optical properties of materials

“Metricon 2010” Prism coupler

Contacts and Location

Contact 1 Mārtiņš Rutkis
Enquire about this equipment
Organisational Unit Institute of Solid State Physics
    University of Latvia

Description

The device is used for determination of refractive index of bulk materials, thin films and liquid materials in the refractive index range of 1.2 to 2.4. Can also be used for determination of thin film thickness measurements.

Specification

  • Simple measurement of optical refractive index
  • Operating wavelengths: 532 nm, 632.8 nm, 1064 nm
  • Refractive index resolution of ±.0005
  • Light polarizations: TE and TM
  • High accuracy index measurement of bulk, substrate, or liquid materials including birefringence/anisotropy
  • Index measurement range 1.2-2.4

Services

The device is used for determination of refractive index of bulk materials, thin films and liquid materials in the refractive index range of 1.2 to 2.4. Can also be used for determination of thin film thickness measurements.

Funding Source

Other -
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