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X-ray Diffractometer PANalytical X’Pert Pro powder

Research equipment for analysis of morphology, mechanical properties, content and structure of materials.

X-ray Diffractometer PANalytical X’Pert Pro powder

Contacts and Location

Description

Research equipment for analysis of morphology, mechanical properties, content and structure of materials.

Specification

Cu anode, wavelength 0.154 nm, max. 2.2 kW, 60 kV, long fine focus ceramic tube, type PW3373/00.

Services

High resolution powder diffraction, phase identification and quantitative phase analysis, analysis of thin films and coatings, crystallite size and strain determination, kinetic and non-ambient experiments.

Funding Source

Other -
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