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  • Scanning electron microscope (SEM) Nova NanoSEM 650

    The Nova NanoSEM 650 offers a high-precision 150 mm piezo-electric stage for fast, precise navigation, providing 100-percent coverage of six-inch wafers or masks, and substatial coverage of eight-inch samples. Fast beam blanking, integrated 16-bit pa

    • Organisational Unit: Institute of Silicate Materials - Latvia, Riga
    • Price: Contract price

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