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Scanning electron microscope (SEM) Nova NanoSEM 650

The Nova NanoSEM 650 offers a high-precision 150 mm piezo-electric stage for fast, precise navigation, providing 100-percent coverage of six-inch wafers or masks, and substatial coverage of eight-inch samples. Fast beam blanking, integrated 16-bit pa

Scanning electron microscope (SEM) Nova NanoSEM 650

Contacts and Location

Description

The Nova NanoSEM 650 offers a high-precision 150 mm piezo-electric stage for fast, precise navigation, providing 100-percent coverage of six-inch wafers or masks, and substatial coverage of eight-inch samples. Fast beam blanking, integrated 16-bit pa

Specification

  • Resolution: 0.8 nm @ 15 kV to 3.5 nm @ 100 V (high vacuum imaging)
  • Magnification: 35X to 1,000,000X
  • Specimen Size: Small and large samples can be accommodated inside the large chamber
  • Stage Type: 150 x 150 nm piezo stage (Nova NanoSEM 650)
  • Stage Motorization: Piezo-motors
  • Accelerating Voltage: 50 eV to 30 keV
  • Imaging Modes: SE (secondary electron), BSE (backscatter electron), Down hole, and Charge reduction
  • Applications: Materials science, Materials research, materials characterization
  • Field of View: Max. 4 mm

Services

  • high-precision 150 mm piezo-electric stage for fast, precise navigation, providing 100-percent coverage of six-inch wafers or masks, and substatial coverage of eight-inch samples;
  • prototyping and lithography applications

Status

free for rental
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