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Contacts and Location
| Enquire about this equipment | |
| Organisational Unit |
Riga Technical University Faculty of Natural Sciences and Technology [14E00] Institute of Materials and Surface Technology - Latvia, Rīga |
Description
Atomic Force Microscope
Specification
Sample size:5x5x2cm Scanner:90x90x7.5um Min scanning step (DAC): 0.1nm [high voltage]; 0.025nm [low voltage] (lateral) (vertical: 0.007 and 0.0025 nm for hi and lo voltage) SPM head:AFM Optics:On-axis microscope with video monitor for probe tip and sample view. 5:1 zoom, up to 3500x magnification, standard 20x objective. XY sample positioning: 8x8mm Positioning resolution: 1um
Scanning modes: STM, AFM (contact, noncontact, semicontact), LFM, phase imaging.
Services
Visualization of nanostructures in materials science (surface morphology)
Funding Source
| Other | - |
|---|
Manufacturer
Veeco Digital Instruments
Model
CP II
Project supported by:
