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Scanning Probe Microscope

Research equipment for analysis of morphology, mechanical properties, content and structure of materials.

Scanning Probe Microscope

Contacts and Location

Contact 1 Rolands Grants
Enquire about this equipment
Organisational Unit Institute of Solid State Physics
    University of Latvia

Description

Research equipment for analysis of morphology, mechanical properties, content and structure of materials.

Specification

  • scanning area 100×100×7.5μ m;
  • Sample size: up to 10x10 mm;
  • Scanning by sample;
  • manual XY stage 8×8 mm;
  • motorized Z stage;
  • optical microscope (20×) for tip and sample view

Services

Imaging of surfaces using different SPM techniques:

  • Contact Mode, Tapping Mode, Force Modulation Mode;
  • Scanning Tunneling Microscopy (STM);
  • Magnetic Force Microscopy (MFM);
  • Nanolithography by mechanical scratch.

Funding Source

Other -
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