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Viewing services matching the following properties:

  • 3D scanning

    3D scanning, the process of converting physical objects into precise digital models, enables to quickly and accurately capture object’s shape and geometries. This process supplies with a complete digital representation of part to be used for reverse engineering, quality inspection or at any point of a typical manufacturing cycle.

    • Organisational Unit: Vidzeme University of Applied Sciences - Latvia, Valmiera
    • Price: Contract price

    Equipment associated with this service:

  • 3D scanning and measuring (ROMER Absolute Arm)

    Industrial grade 3D scanning and measuring arm is taking reverse engineering to the next level. Rommer Absolute arm in combination with Laser Scanner also recognizes shiny metal surfaces.

    • Organisational Unit: RTU Design Factory - Latvia, Riga
    • Price: 105.00 €
    • * All prices are specified without VAT
  • Determination of calorimetric properties

    Detremination according to manual of differential scanning calorimeter

    • Organisational Unit: Institute of Polymer Materials - Latvia, Riga
    • Price: Contract price

    Equipment associated with this service:

  • Preparation of the report about obtained results with Ultra high resolution scanning electron microscopy (Nova NanoSEM™ 650)

    Processing of SEM images, compositional measurements by SEM/EDS and obtained data interpretation. The major sections of the report are: introduction, sample preparation, experimental, results, discussion, conclusion, references and appendix.

    • Organisational Unit: Institute of Silicate Materials - Latvia, Riga
    • Price: 55.00 €
    • * All prices are specified without VAT
  • Ultra-high resolution field emission scanning electron microscopy (Nova NanoSEM™ 650) imaging

    Characterization of solid material surface structure and morphology. Field emission scanning electron microscopy imaging is performed at high and ultra-high magnifications. From the obtained high-resolution images (Depending on the material being imaged, the resolution of the system is about 2nm.) it is possible to precisely measure very small features and objects (surface or cross-sectioned). This service will include FESEM images of samples with the option for sputter coating and interpretation of results on request. Advanced sample preparation is also offered for an additional fee

    • Organisational Unit: Institute of Silicate Materials - Latvia, Riga
    • Price: 220.00 €
    • * All prices are specified without VAT
  • Ultra-high resolution scanning electron microscopy (Nova NanoSEM™ 650) chemical analysis obtained with Energy Dispersive X-ray spectroscopy (EDS) line analysis

    The SEM/EDS is capable to perform line scan analysis of selected locations on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. EDS spectra can be collected across the specimen’s image area in a line. Weight and atomic percentages are calculated for each identified element. The line scans provide additional flexibility to customize the number of measurement points in a line.

    • Organisational Unit: Institute of Silicate Materials - Latvia, Riga
    • Price: 220.00 €
    • * All prices are specified without VAT
  • Ultra-high resolution scanning electron microscopy (Nova NanoSEM™ 650) chemical analysis obtained with Energy Dispersive X-ray spectroscopy (EDS) mapping

    The SEM/EDS is capable to perform mapping analysis of selected locations on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. Phase Mapping automatically collects spectra, elemental maps, and phase maps with elemental distributions and associated spectra. Weight and atomic percentages are calculated for each identified element.

    • Organisational Unit: Institute of Silicate Materials - Latvia, Riga
    • Price: 220.00 €
    • * All prices are specified without VAT
  • Ultra-high resolution scanning electron microscopy (Nova NanoSEM™ 650) chemical analysis obtained with Energy Dispersive X-ray spectroscopy (EDS) point analysis

    The SEM/EDS is capable to perform analysis of selected point location on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. EDS spectra can be collected across the specimen’s image area, including individual points, multiple points, selected areas or freehand draw. Weight and atomic percentages are calculated for each identified element.

    • Organisational Unit: Institute of Silicate Materials - Latvia, Riga
    • Price: 220.00 €
    • * All prices are specified without VAT

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