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Processing of SEM images, compositional measurements by SEM/EDS and obtained data interpretation. The major sections of the report are: introduction, sample preparation, experimental, results, discussion, conclusion, references and appendix.
Characterization of solid material surface structure and morphology. Field emission scanning electron microscopy imaging is performed at high and ultra-high magnifications. From the obtained high-resolution images (Depending on the material being imaged, the resolution of the system is about 2nm.) it is possible to precisely measure very small features and objects (surface or cross-sectioned). This service will include FESEM images of samples with the option for sputter coating and interpretation of results on request. Advanced sample preparation is also offered for an additional fee
Equipment associated with this service:
The SEM/EDS is capable to perform line scan analysis of selected locations on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. EDS spectra can be collected across the specimen’s image area in a line. Weight and atomic percentages are calculated for each identified element. The line scans provide additional flexibility to customize the number of measurement points in a line.
The SEM/EDS is capable to perform mapping analysis of selected locations on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. Phase Mapping automatically collects spectra, elemental maps, and phase maps with elemental distributions and associated spectra. Weight and atomic percentages are calculated for each identified element.
The SEM/EDS is capable to perform analysis of selected point location on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. EDS spectra can be collected across the specimen’s image area, including individual points, multiple points, selected areas or freehand draw. Weight and atomic percentages are calculated for each identified element.