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  • Ultra-high resolution field emission scanning electron microscopy (Nova NanoSEM™ 650) imaging

    Characterization of solid material surface structure and morphology. Field emission scanning electron microscopy imaging is performed at high and ultra-high magnifications. From the obtained high-resolution images (Depending on the material being imaged, the resolution of the system is about 2nm.) it is possible to precisely measure very small features and objects (surface or cross-sectioned). This service will include FESEM images of samples with the option for sputter coating and interpretation of results on request. Advanced sample preparation is also offered for an additional fee

    • Organisational Unit: Institute of Silicate Materials - Latvia, Rīga
    • Price: 140.00 €
    • * All prices are specified without VAT

    Equipment associated with this service:

  • Ultra-high resolution field emission scanning electron microscopy (Nova NanoSEM™ 650) imaging

    Characterization of solid material surface structure and morphology. Field emission scanning electron microscopy imaging is performed at high and ultra-high magnifications. From the obtained high-resolution images (Depending on the material being imaged, the resolution of the system is about 2nm.) it is possible to precisely measure very small features and objects (surface or cross-sectioned). This service will include FESEM images of samples with the option for sputter coating and interpretation of results on request. Advanced sample preparation is also offered for an additional fee

    • Organisational Unit: Institute of Silicate Materials - Latvia, Rīga
    • Price: Contract price

    Equipment associated with this service:

  • Ultra-high resolution scanning electron microscopy (Nova NanoSEM™ 650) chemical analysis obtained with Energy Dispersive X-ray spectroscopy (EDS) line analysis

    The SEM/EDS is capable to perform line scan analysis of selected locations on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. EDS spectra can be collected across the specimen’s image area in a line. Weight and atomic percentages are calculated for each identified element. The line scans provide additional flexibility to customize the number of measurement points in a line.

    • Organisational Unit: Institute of Silicate Materials - Latvia, Rīga
    • Price: 220.00 €
    • * All prices are specified without VAT

    Equipment associated with this service:

  • Ultra-high resolution scanning electron microscopy (Nova NanoSEM™ 650) chemical analysis obtained with Energy Dispersive X-ray spectroscopy (EDS) mapping

    The SEM/EDS is capable to perform mapping analysis of selected locations on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. Phase Mapping automatically collects spectra, elemental maps, and phase maps with elemental distributions and associated spectra. Weight and atomic percentages are calculated for each identified element.

    • Organisational Unit: Institute of Silicate Materials - Latvia, Rīga
    • Price: 220.00 €
    • * All prices are specified without VAT

    Equipment associated with this service:

  • Ultra-high resolution scanning electron microscopy (Nova NanoSEM™ 650) chemical analysis obtained with Energy Dispersive X-ray spectroscopy (EDS) point analysis

    The SEM/EDS is capable to perform analysis of selected point location on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. EDS spectra can be collected across the specimen’s image area, including individual points, multiple points, selected areas or freehand draw. Weight and atomic percentages are calculated for each identified element.

    • Organisational Unit: Institute of Silicate Materials - Latvia, Rīga
    • Price: 220.00 €
    • * All prices are specified without VAT

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