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  • Atomic force microscopy VEECO SPM II, imaging

    Atomic force microscope can not only image in three-dimensional topography, but it also provides various types of surface measurements. It is powerful because an AFM can generate images at atomic resolution with angstrom scale resolution height information, with minimum sample preparation using CT (contact mode), NC (noncontact mode) and ICM (intermittent contact mode).

    • Price: 70.00 €
    • * All prices are specified without VAT
  • BET nitrogen absorption, multipoint. (NOVA 1200e, Quantachrome Instruments)

    Surface area measurements of solid and powdered materials (BET, Langmuir, T-plot and other methods); pore size distribution (DFT, BJH); pore volume determination (one point) and adsorption and desorption isotherms. It includes materials such as carbon fibers, catalysts, organic materials, minerals, metal powder and ferrite composite materials, fibers, hardened foam, soil, sludge, various types of ceramic materials, etc.

    • Price: 80.00 €
    • * All prices are specified without VAT
  • Pore Size by Mercury Intrusion (PoreMaster Porozimetrs PM-33-13, Quantachrome Instruments)

    Porosity (%) and pore size/volume distribution of solid samples. Intended for the materials such as catalysts, surgical implants, electrodes, concrete, ceramics and metallic compounds, pharmaceuticals, membranes, filters, etc.

    • Price: 120.00 €
    • * All prices are specified without VAT
  • Preparation of sample surface for SEM analysis (surface coating with carbon)

    The Carbon Coater is one of the most advanced sample coaters available for coating of non-conductive specimens prior to SEM X-ray analysis. Carbon is best used for EDS application.

    • Price: 30.00 €
    • * All prices are specified without VAT

    Equipment associated with this service:

  • Preparation of samples surface for SEM analysis (surface coating with a thin layer of a metal - Cr, Au, Pt/Pd - optionally)

    Sputter coating for SEM is a process of applying an ultra-thin coating of electrically-conducting metal onto a non-conducting or poorly conducting specimen. Coating of samples is required to enable or improve the imaging of samples. Creation of a conductive layer of metal on the sample inhibits charging, reduces thermal damage and improves the secondary electron signal required for topographic examination in the SEM. The coating technique that should be used depends on the required resolution and application. Chromium sputtered surface has very fine grain size which is most useful for FESEM imaging. Gold target is excellent and most widely used target material for standard SEM coating. But it should be noted that grain size is visible at high magnifications. Platinum/Paladium is also adequate for FESEM imaging. Its grain size is similar to Pt.

    • Price: 60.00 €
    • * All prices are specified without VAT
  • Preparation of the report about obtained results with Ultra high resolution scanning electron microscopy (Nova NanoSEM™ 650)

    Processing of SEM images, compositional measurements by SEM/EDS and obtained data interpretation. The major sections of the report are: introduction, sample preparation, experimental, results, discussion, conclusion, references and appendix.

    • Price: 55.00 €
    • * All prices are specified without VAT
  • Preparation of the report about obtained results with X-ray analysis Rigaku Ultima +

    The major sections of reports are: introduction, sample preparation, experimental, results, discussion, conclusion, references and appendix.

    • Price: 65.00 €
    • * All prices are specified without VAT
  • Qualitative X-ray analysis Rigaku Ultima +

    X-ray powder diffraction is a rapid non-destructive analytical technique primarily used for phase identification of a crystalline material. Determination of unknown solids is critical to studies in geology, environmental science, materials science, engineering and biology.

    • Price: 60.00 €
    • * All prices are specified without VAT

    Equipment associated with this service:

  • Quantitative analysis Rigaku Ultima +

    Jade 9.3 program linked with the latest ICDD-PDF-4+, and PD-4 Organics databases with Sleve+ software provides the most flexible and powerful data analysis and presentation solution including phase analysis, search/matching, and quantification (phase analysis, crystallite size etc.).

    • Price: 110.00 €
    • * All prices are specified without VAT
  • The sample cross-section preparation

    In most cases, surface observation alone cannot provide information concerning the cross sectional structure of granular materials, layered materials, fibrous materials, and powders, etc. Cross-section preparation is carried out with Minitom™ machine by cutting the samples with a Diamond Cut-off Wheel, which is cooled during the cutting process using distilled water with Corrozip™ additive to improve the cutting and cooling qualities. After the specimen size is adjusted to mounting cup size samples are mounted in epoxy resin by vacuum impregnation with CitoVac™ equipment. Finally, materialographic fine grinding and polishing is performed on fully automated Tegramin-20™ system by using different polishing discs and abrasive media.

    • Price: 80.00 €
    • * All prices are specified without VAT
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