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Contacts and Location
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Organisational Unit |
Riga Technical University Faculty of Natural Sciences and Technology Institute of Silicate Materials - Latvia, Rīga |
Description
Atomic force microscope can not only image in three-dimensional topography, but it also provides various types of surface measurements. It is powerful because an AFM can generate images at atomic resolution with angstrom scale resolution height information, with minimum sample preparation using CT (contact mode), NC (noncontact mode) and ICM (intermittent contact mode).
Service fields
analyse | - |
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