Share this
Map

Atomic force microscopy VEECO SPM II, imaging

Atomic force microscope can not only image in three-dimensional topography, but it also provides various types of surface measurements. It is powerful because an AFM can generate images at atomic resolution with angstrom scale resolution height information, with minimum sample preparation using CT (contact mode), NC (noncontact mode) and ICM (intermittent contact mode).

Contacts and Location

Description

Atomic force microscope can not only image in three-dimensional topography, but it also provides various types of surface measurements. It is powerful because an AFM can generate images at atomic resolution with angstrom scale resolution height information, with minimum sample preparation using CT (contact mode), NC (noncontact mode) and ICM (intermittent contact mode).

Service fields

analyse -
Back to all
0 items in cart
Total: 0
You have no items in a cart
Go to checkout
Go Enquire