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Atomic force microscope

High resolution atomic force microscope with different modes

Atomic force microscope

Contacts and Location

Description

High resolution atomic force microscope with different modes

Specification

Single module flexure XY-scanner with closed-loop control 50 µm × 50 µm (optional 10 µm × 10 µm or 100 µm × 100 µm). Resolution : 0.05 nm; Position detector noise : < 0.25 nm (bandwidth: 1 kHz);Out-of-plane motion : < 2 nm (over 40 µm scan).

Services

High resolution surface scanning

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