Small microstructure analysis equipment (Scanning Electron Microscope (SEM)) VEGA LMS

TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This combination significantly simpl

Contacts and Location

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Organisational Unit	Riga Technical University Faculty of Natural Sciences and Technology Institute of Biomaterials and Bioengineering - Latvia, Rīga

Description

TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This combination significantly simplifies acquisition of both morphological and elemental data from the sample, making VEGA SEM an efficient analytical solution for routine materials inspection in quality control, failure analysis and research labs.

Specification

Electron Gun: Heated tungsten filament cathode Electron Optics: Wide Field Optics™ Technology with Intermediate Lens™ and In-Flight Beam Tracing™ Resolution: High Vacuum Mode: 3 nm at 30 keV 8 nm at 3 keV Low Vacuum Mode: 3.5 nm at 30 keV with BSE detector* 3.5 nm at 30 keV with LVSTD detector*

optional detectors Maximum Field of View: >50 mm at max WD

Services

Scanning Electron Microscope

Contract title

Mazizmēra mikrostruktūras analīzes iekārta (Skenējošais elektronu mikroskops) VEGA LMS

Contract short description

TESCAN VEGA 4. paaudzes skenējošais elektronu mikroskops (SEM) ar volframa kvēldiega elektronu avotu apvieno SEM attēlveidošanu un tiešo elementu sastāva analīzi vienā TESCAN Essence ™ programmatūras logā. Šī kombinācija ievērojami vienkāršo gan morfoloģisko, gan elementāro datu iegūšanu no parauga, padarot VEGA SEM par efektīvu analītisku risinājumu ikdienas materiālu pārbaudei kvalitātes kontroles, kļūmju analīzes un izpētes laboratorijās

Contract full description

Elektronu lielgabals: volframa kvēldiega katods Elektronu optika: Wide Field Optics ™ tehnoloģija ar starpposma objektīvu ™ un lidojuma staru izsekošanu ™ Izšķirtspēja: Augsta vakuuma režīms: 3 nm pie 30 keV 8 nm pie 3 keV Zema vakuuma režīms: 3,5 nm pie 30 keV ar GSE detektoru* 3,5 nm pie 30 keV ar LVSTD detektoru*

papildu detektori Maksimālais redzes lauks:> 50 mm pie maksimālā WD

Embedded Content

Funding Source

EU Structual Funds (ERAF, ESF)	-

Small microstructure analysis equipment (Scanning Electron Microscope (SEM)) VEGA LMS

TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This combination significantly simpl

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