Ultra-high resolution scanning electron microscopy (Nova NanoSEM™ 650) chemical analysis obtained with Energy Dispersive X-ray spectroscopy (EDS) line analysis

The SEM/EDS is capable to perform line scan analysis of selected locations on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. EDS spectra can be collected across the specimen’s image area in a line. Weight and atomic percentages are calculated for each identified element. The line scans provide additional flexibility to customize the number of measurement points in a line.

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Organisational Unit	Riga Technical University Faculty of Materials Science and Applied Chemistry Institute of Silicate Materials - Latvia, Rīga

Description

The SEM/EDS is capable to perform line scan analysis of selected locations on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. EDS spectra can be collected across the specimen’s image area in a line. Weight and atomic percentages are calculated for each identified element. The line scans provide additional flexibility to customize the number of measurement points in a line.

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