Ultra-high resolution scanning electron microscopy (Nova NanoSEM™ 650) chemical analysis obtained with Energy Dispersive X-ray spectroscopy (EDS) point analysis

The SEM/EDS is capable to perform analysis of selected point location on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. EDS spectra can be collected across the specimen’s image area, including individual points, multiple points, selected areas or freehand draw. Weight and atomic percentages are calculated for each identified element.

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Organisational Unit	Riga Technical University Faculty of Materials Science and Applied Chemistry Institute of Silicate Materials - Latvia, Rīga

Description

The SEM/EDS is capable to perform analysis of selected point location on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. EDS spectra can be collected across the specimen’s image area, including individual points, multiple points, selected areas or freehand draw. Weight and atomic percentages are calculated for each identified element.

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analyse	-

Service ID #: 282

Last Updated: 30^th August, 2021

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