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Scanning electron microscope

Research equipment for analysis of morphology, mechanical properties, content and structure of materials.

Scanning electron microscope

Contacts and Location

Contact 1 Karlis Kundzins
Enquire about this equipment
Organisational Unit Institute of Solid State Physics
    University of Latvia

Description

Research equipment for analysis of morphology, mechanical properties, content and structure of materials.

Specification

  • Resolution of 3 nm at 30 kV
  • Beam current in range from 0.5 pA to 5 μA,
  • Image modes:
    • secondary electron image (SE),
    • backscattered electron image (BSE),
    • topography (TOPO), composition (COMPO),
    • shadowed.
  • EDX Oxford instruments INCA 350
  • Si detector 10mm2 area, resolution at Mn 133eV.

Services

Applied physics, material science.

Funding Source

Other -

Categories

Other (174)

Equipment ID #: 1389

Last Updated: 8th September, 2015

Unique views: 725

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Manufacturer

Carl Zeiss

Model

EVO 50 XVP

Contract price
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Riga Technical University
6A Kipsalas Street, Riga, Latvia, LV-1048 / map
usescience@rtu.lv

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