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Scanning Kelvin Probe system SKP5050

Research equipment for physical and physico-chemical analysis of materials.

Scanning Kelvin Probe system SKP5050

Contacts and Location

Contact 1 Aivars Vembris
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Organisational Unit Institute of Solid State Physics
    University of Latvia

Description

Research equipment for physical and physico-chemical analysis of materials.

Specification

Measurement capability: Two-dimensional surface potential measurements Surface potential measurement range: –9,6 to 9,6 V Work Function resolution: 1-3meV Tip size: 2mm diameter Max. Scan area: 50mm x 50 mm Position resolution: 318 nanometre Sample stage control: Manual and auto Maximum thickness of sample: 20mm

Services

Measurement of surface potential of organic compounds, determination of work function of metals and Fermi level of inorganic semiconductors.

Funding Source

Other -
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