Viewing equipment matching the following properties:
The Verios 5 XHR SEM offers subnanometer resolution over the full 1 keV to 30 keV energy range with excellent materials contrast. Unprecedented levels of automation and ease-of-use make this performance accessible to users of any experience level.
PC controlled SEM with conventional tungsten heated cathode, EDS and EBSD
This SEM can be used for high resolution sample observation as well as elemental analysis.