Contacts and Location
Contact 1 | Karlis Kundzins |
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Enquire about this equipment | |
Organisational Unit |
Institute of Solid State Physics University of Latvia |
Description
Research equipment for analysis of morphology, mechanical properties, content and structure of materials
Specification
Contact AFM, resonant Mode AFM (semicontact + noncontact), phase Imaging, force Modulation spreading resistance imaging, SCM, MFM, EFM. AFM, Voltage, RM Lithographies Piezo scanner range 50 x 50 x 2 μm Min. scanning step 15 pm Scan Type: by Probe Sample positioning range 5x5mm Positioning resolution 5μm Optical viewing system with field of view 0.5 to 2 mm
Services
Applied physics, material science, thin films
Funding Source
Other | - |
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Manufacturer
Smena
Model
NT-MDT