Contacts and Location
Contact 1 | Mārtiņš Rutkis |
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Enquire about this equipment | |
Organisational Unit |
Institute of Solid State Physics University of Latvia |
Description
The device is used for determination of refractive index of bulk materials, thin films and liquid materials in the refractive index range of 1.2 to 2.4. Can also be used for determination of thin film thickness measurements.
Specification
Services
The device is used for determination of refractive index of bulk materials, thin films and liquid materials in the refractive index range of 1.2 to 2.4. Can also be used for determination of thin film thickness measurements.
Funding Source
Other | - |
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Manufacturer
Metricon
Model
2010