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TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This combination significantly simpl
A variable pressure FE SEM that supplements all the advantages of the high vacuum model with extended facilities for low vacuum operations, allowing investigation of nonconductive specimens in their natural uncoated state. The electrons interact wit