Viewing equipment matching the following properties:
The Verios 5 XHR SEM offers subnanometer resolution over the full 1 keV to 30 keV energy range with excellent materials contrast. Unprecedented levels of automation and ease-of-use make this performance accessible to users of any experience level.
ZEISS LSM 900 provides this with components optimized to deliver the best imaging results, including LSM Plus for a unique confocal experience, effortlessly improving all your multi-color and live cell acquisitions.
TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This combination significantly simpl