Viewing equipment matching the following properties:
The electrons interact with atoms in the sample, producing various signals (secondary electrons, backscattered electrons, X-rays), that can be detected and that contain information about the sample's surface topography and composition.
FT-IR Spectrometers for measuring all IR frequencies simultaneously presenting the desired spectral information for analysis.With FT-IR you can sample solids, liquids, powders, pastes– all in a matter of minutes.
As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ow
