Contacts and Location
Contact 1 | Raimonds Meija |
---|---|
Enquire about this equipment | |
Organisational Unit |
Institute of Chemical Physics University of Latvia |
Description
This SEM can be used for high resolution sample observation as well as elemental analysis.
Specification
5 Specification [main functions, parameters] Gun – Cold cathode field emission type Resolution:
HV range – 0.5kV – 30kV Magnification range:
Detectors:
EDS detector – 123eV
Services
Has upper and lower secondary electron (SE) detectors for topological measurements /contrast, BSE detector for elemental contrast and TE detector, when observer is ignorant to surface charasteristics. With addition of EDS detector, system provides qualitative and quantitative elemental analysis (up to Be) with spatial resolution 1µm2. 9 Service (that can be provided with this item) Has upper and lower secondary electron (SE) detectors for topological measurements /contrast, BSE detector for elemental contrast and TE detector, when observer is ignorant to surface charasteristics. With addition of EDS detector, system provides qualitative and quantitative elemental analysis (up to Be) with spatial resolution 1µm2 Can be used for in-situ nanomanipulation and electrical measurements (when combined with SmarAct 13D nanomanipulation system).
Manufacturer
Hitachi - SEM Bruker XFlash Quad
Model
S-4800 Hitachi Field Emission SEM with Bruker XFlash Quad 5040