Viewing equipment matching the following properties:
The Bruker EMX EPR spectrometer is a research grade scientific instrument. It is capable of routine measurements, as well as sophisticated and advanced experiments.
Surgical C- arc X-ray equipment
Most novel high-resolution X-ray diffractometer available today
The D8 diffractometers are designed to easily accomodate all X-Ray difraction in material research, powder diffraction and phase analysis
Research equipment for analysis of morphology, mechanical properties, content and structure of materials.
X-ray diffraction is one of the most important non-destructive methods for the analysis of all classes of materials - from liquids to powders and crystals.
As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ow
Etalonsystem, Calibration of dosimeters
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a technique for analyzing the surface chemistry of a material. XPS can measure the elemental composition, empirical formula, chemical state
Qualitative and quantitative phase analysis, suitable for analysis of different samples in different conditions.
