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  • Transmission electron microscopy analysis

    Well established methods are used to assess the ultrastructure appearing under exposure of treatment, experiments, and pathologic conditions, of various tissues or cultured cells grown on substrates or in suspension. We also perform analyses of subcellular fractions isolated from tissues or cells using routine embedding and fine section observation or negative staining.

    • Organisational Unit: Joint Laboratory of Electron Microscopy - Latvia, Rīga
    • Price: Contract price
  • Transportation of forms and specimens to the laboratory: drive to the building site in Riga

    • Organisational Unit: Construction materials laboratory - Latvia, Rīga
    • Price: Contract price
  • Transportation test reports and investigation conlusions to Client

    • Organisational Unit: Construction materials laboratory - Latvia, Rīga
    • Price: Contract price
  • Tree-ring width and density measures

    Wood surface preparation and wood density measurements.

    • Organisational Unit: Chair of Botany and Ecology - Latvia, Rīga
    • Price: Contract price

    Equipment associated with this service:

  • Triaxial study

    Soil mechanical properties measurements by standard LVS CEN ISO/TS 17892-8, LVS CEN ISO/TS 17892-9, GOST 12248-2010, BS 1377-7, BS 1377-8

    • Organisational Unit: Baltijas jūras ģeoloģijas centrs - Latvia, Rīga
    • Price: Contract price
  • Truck tire overload and overheating detection using video analytics

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    • Organisational Unit: Department of Management Information Technology - Latvia, Rīga
    • Price: 9 890.00 €
    • * All prices are specified without VAT
  • Ultra-high resolution field emission scanning electron microscopy (Nova NanoSEM™ 650) imaging

    Characterization of solid material surface structure and morphology. Field emission scanning electron microscopy imaging is performed at high and ultra-high magnifications. From the obtained high-resolution images (Depending on the material being imaged, the resolution of the system is about 2nm.) it is possible to precisely measure very small features and objects (surface or cross-sectioned). This service will include FESEM images of samples with the option for sputter coating and interpretation of results on request. Advanced sample preparation is also offered for an additional fee

    • Organisational Unit: Institute of Silicate Materials - Latvia, Rīga
    • Price: 140.00 €
    • * All prices are specified without VAT

    Equipment associated with this service:

  • Ultra-high resolution field emission scanning electron microscopy (Nova NanoSEM™ 650) imaging

    Characterization of solid material surface structure and morphology. Field emission scanning electron microscopy imaging is performed at high and ultra-high magnifications. From the obtained high-resolution images (Depending on the material being imaged, the resolution of the system is about 2nm.) it is possible to precisely measure very small features and objects (surface or cross-sectioned). This service will include FESEM images of samples with the option for sputter coating and interpretation of results on request. Advanced sample preparation is also offered for an additional fee

    • Organisational Unit: Institute of Silicate Materials - Latvia, Rīga
    • Price: Contract price

    Equipment associated with this service:

  • Ultra-high resolution scanning electron microscopy (Nova NanoSEM™ 650) chemical analysis obtained with Energy Dispersive X-ray spectroscopy (EDS) line analysis

    The SEM/EDS is capable to perform line scan analysis of selected locations on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. EDS spectra can be collected across the specimen’s image area in a line. Weight and atomic percentages are calculated for each identified element. The line scans provide additional flexibility to customize the number of measurement points in a line.

    • Organisational Unit: Institute of Silicate Materials - Latvia, Rīga
    • Price: 220.00 €
    • * All prices are specified without VAT

    Equipment associated with this service:

  • Ultra-high resolution scanning electron microscopy (Nova NanoSEM™ 650) chemical analysis obtained with Energy Dispersive X-ray spectroscopy (EDS) mapping

    The SEM/EDS is capable to perform mapping analysis of selected locations on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. Phase Mapping automatically collects spectra, elemental maps, and phase maps with elemental distributions and associated spectra. Weight and atomic percentages are calculated for each identified element.

    • Organisational Unit: Institute of Silicate Materials - Latvia, Rīga
    • Price: 220.00 €
    • * All prices are specified without VAT

    Equipment associated with this service:

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