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The SEM/EDS is capable to perform analysis of selected point location on the sample. EDS is analytical technique used for the elemental analysis or chemical characterization of a sample. EDS spectra can be collected across the specimen’s image area, including individual points, multiple points, selected areas or freehand draw. Weight and atomic percentages are calculated for each identified element.
Determination according to LVS EN 448:2003
Equipment associated with this service:
Sample preparation, researching by D8 ADVANCE, description, analysing