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Scanning Electromicroscope

Tabletop Scanning Electron Microscope with Improved Electron-optical System

Scanning Electromicroscope

Contacts and Location

Description

Tabletop Scanning Electron Microscope with Improved Electron-optical System

Specification

"Magnification: ×15 to ×60,000 (Up to ×240,000 with digital zoom) Observation condition:5 kV/15 kV/EDX Signal select:BSE/SE/Mix Observation mode:BSE:Conductor/Standard/Charge-up Reduction SE:Standard/Charge-up Reduction Mix:Standard/Charge-up ReductionImage mode (BSE): COMPO/Shadow 1/Shadow 2/TOPO Sample stage traverse:X: 35.0 mm, Y: 35.0 mm Maximum sample size:70 mm in diameterMaximum sample height: 50 mm "

Services

Scanning Electron Microscope

Contract title

Skenējošais elektromikroskops

Contract short description

Galda skenējošs elektronu mikroskops ar uzlabotu elektronu optisko sistēmu

Contract full description

"Palielinājums: × 15 līdz × 60 000 (līdz × 240 000 ar digitālo tālummaiņu) Novērošanas nosacījums: 5 kV/15 kV/EDX Signāla izvēle: GSE/SE/Mix Novērošanas režīms: GSE: Vadītājs/Standarta/Uzlādes samazināšana SE: Standarta/uzlādes samazināšana Sajaukums: standarta/uzlādes samazināšanas attēla režīms (GSE): COMPO/Ēna 1/Ēna 2/TOPO Parauga skatuves traverss: X: 35,0 mm, Y: 35,0 mm Maksimālais parauga izmērs: 70 mm diametrāMaksimālais parauga augstums: 50 mm "

Embedded Content

Funding Source

EU Structual Funds (ERAF, ESF) -
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