Contacts and Location
Enquire about this equipment | |
Organisational Unit |
Riga Technical University Faculty of Natural Sciences and Technology Institute of Biomaterials and Bioengineering - Latvia, Rīga |
Description
TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This combination significantly simplifies acquisition of both morphological and elemental data from the sample, making VEGA SEM an efficient analytical solution for routine materials inspection in quality control, failure analysis and research labs.
Specification
Electron Gun: Heated tungsten filament cathode Electron Optics: Wide Field Optics™ Technology with Intermediate Lens™ and In-Flight Beam Tracing™ Resolution: High Vacuum Mode: 3 nm at 30 keV 8 nm at 3 keV Low Vacuum Mode: 3.5 nm at 30 keV with BSE detector* 3.5 nm at 30 keV with LVSTD detector*
Services
Scanning Electron Microscope
Contract title
Contract short description
Contract full description
Elektronu lielgabals: volframa kvēldiega katods Elektronu optika: Wide Field Optics ™ tehnoloģija ar starpposma objektīvu ™ un lidojuma staru izsekošanu ™ Izšķirtspēja: Augsta vakuuma režīms: 3 nm pie 30 keV 8 nm pie 3 keV Zema vakuuma režīms: 3,5 nm pie 30 keV ar GSE detektoru* 3,5 nm pie 30 keV ar LVSTD detektoru*
Embedded Content
Funding Source
EU Structual Funds (ERAF, ESF) | - |
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Manufacturer
TESCAN
Model
VEGA LMS
Funded by EU