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Transmission electron microscope

Research equipment for analysis of morphology, mechanical properties, content and structure of materials.

Transmission electron microscope
Transmission electron microscope

Contacts and Location

Contact 1 Martins Rutkis
Enquire about this equipment
Organisational Unit Institute of Solid State Physics
    University of Latvia

Description

Research equipment for analysis of morphology, mechanical properties, content and structure of materials.

Specification

  • TEM point resolution 0.25 nm, line resolution 0.102 nm, information limit 0.14 nm.
  • Schottky field emitter with high maximum beam current (> 100 nA), energy spread 0.7 eV.
  • Flexible high tension (20, 40, 80, 120,160, 200 kV and values in between)
  • Fully computer-controlled, eucentric side-entry, high stability
  • CompuStage
  • X, Y movement ± 1 mm, Z movement ± 0.375 mm; specimen size 3 mm

Services

Applied physics, material science.

Funding Source

Other -
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